Type(s) de contenu et mode(s) de consultation : Texte noté : électronique

Titre(s) : Models in hardware testing [Texte électronique] : lecture notes of the forum in honor of Christian Landrault / edited by Hans-Joachim Wunderlich

Publication : Dordrecht ; London : Springer, cop. 2010

Description matérielle : 1 ressource dématérialisée

Collection : Frontiers in electronic testing ; 43

Note(s) : Includes bibliographical references and index
"Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. Models in Hardware Testing treats models and especially fault models in hardware testing in a comprehensive way not found anywhere else. Engineers who are responsible for product quality and test coverage, students who want to learn about quality assessment for new technologies or lecturers who are interested in the most recent advances in model based hardware testing will take benefits from reading. The material collected in Models in Hardware Testing was prepared for the forum in honor of Christian Landrault in connection with the European Test Symposium 2009"--Publisher's website

Autre(s) auteur(s) : Wunderlich, Hans-Joachim. Fonction indéterminée  Voir les notices liées en tant qu'auteur
Landrault, Christian. Fonction indéterminée  Voir les notices liées en tant qu'auteur

Sujet(s) : Circuits intégrés -- Simulation par ordinateur  Voir les notices liées en tant que sujet

Indice(s) Dewey :  621.382 15 (23e éd.) = Architecture des réseaux de télécommunications (technologie)  Voir les notices liées en tant que sujet

Identifiants, prix et caractéristiques : ISBN 9789048132829

Identifiant de la notice  : ark:/12148/cb447198929

Notice n° :  FRBNF44719892 (notice reprise d'un réservoir extérieur)

Table des matières : Open Defects in Nanometer Technologies / J. Figueras, R. Rodríguez-Montañés, D. Arumí ; Models for Bridging Defects / M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi ; Models for Delay Faults / S.M. Reddy ; Fault Modeling for Simulation and ATPG / B. Becker, I. Polian ; Generalized Fault Modeling for Logic Diagnosis / H.-J. Wunderlich, S. Holst ; Models in Memory Testing / S. Di Carlo, P. Prinetto ; Models for Power-Aware Testing / P. Girard, H.-J. Wunderlich ; Physical Fault Models and Fault Tolerance / J. Arlat, Y. Crouzet.