Notice bibliographique

Notice

Type(s) de contenu et mode(s) de consultation : Texte noté : électronique

Auteur(s) : Sun, Yongke Voir les notices liées en tant qu'auteur

Titre(s) : Strain Effect in Semiconductors [Texte électronique] : Theory and Device Applications / by Yongke Sun, Scott E. Thompson, Toshikazu Nishida

Édition : 1st.

Publication : Boston, MA : Springer US : Springer e-books, 2010

Description matérielle : 1 online resource

Note(s) : Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strain-based MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities

Autre(s) auteur(s) : Thompson, Scott E.. Fonction indéterminée Voir les notices liées en tant qu'auteur
Nishida, Toshikazu (1963-....). Fonction indéterminée Voir les notices liées en tant qu'auteur