Notice bibliographique
- Notice
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039 .. $o GEA $a 006087706
100 .. $a 19990418d1998 k y0frey50 ba
101 0. $a eng
102 .. $a US
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181 .0 $6 01 $a i $b xxxe
181 .. $6 02 $c txt $2 rdacontent
182 .0 $6 01 $a n
182 .. $6 02 $c n $2 rdamedia
200 1. $a 1998 IEEE international integrated reliability workshop final report $b Texte imprimé $e Stanford Sierra camp, Lake Tahoe, California, October 12-15, 1998 $f sponsored by the IEEE electron devices society and the IEEE reliability society
210 .. $a Piscataway $c EDS $c Reliability society of the IEEE $d cop. 1998
215 .. $a VI-140 p. $c ill. $d 28 cm
300 .. $a Notes bibliogr. en fin de chapitre
606 .. $3 12211448 $a Intégration sur tranche entière (circuits intégrés) $3 11939588 $x Fiabilité $2 rameau
676 .. $a 621.381 5 $v 23
710 || $3 14507817 $a International integrated reliability workshop $f (1998 $e Lake Tahoe, Calif. $4 070
712 11 $3 14507830 $o ISNI0000000121573981 $a Institute of electrical and electronics engineers $b Professional technical group on reliability $4 340
801 .0 $a FR $b FR-751131015 $c 19990418 $g AFNOR $h FRBNF373213870000004 $2 intermrc
930 .. $5 FR-751131009:37321387001001 $a 2000-124081 $b 759999999 $c Tolbiac - Rez de Jardin - Sciences et technique - Magasin $d O
